mySEM®: Scanning Electron Microscope


The mySEM is a research-grade scanning electron microscope for imaging and characterizing nanoscale objects and materials. It is powered by Novelx's patented Stacked Silicon technology. It is optimized for low-voltage operation and does not require non-conductive samples to be coated. This makes the mySEM an ideal choice for non-destructive imaging of energy sensitive samples, biomaterials and thin films.

Product Released: 
January, 2009
Information Verified: 
March, 2013

Californa Locations:

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