MultiProbe™ AFP II Nanoprober

Description:

The AFP is a high-resolution imaging and probing tool that electrically characterizes advanced circuitry with proven measurement capabilities for technology nodes as small as 22nm. It is used to perform physical and electrical measurements without requiring the use of a vacuum chamber or destructive techniques such as FIB marking or SEM inspection.

Information Verified: 
March, 2013

Californa Locations:

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